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TENTH INTERNATIONAL SYMPOSIUM ON PARTICLES ON SURFACES: DETECTION, ADHESION AND REMOVAL Toronto, Canada, June 19 - 21, 2006 | |
| This will be the tenth event in the series of symposia on particles on surfaces initiated as part of the Fine Particle Society meeting in 1986. Particles are yield detractors in the manufacture of sophisticated and sensitive electronic components and are very undesirable in many other technologies. Contamination of optical surfaces and shorting of microelectronic circuits by conducting particles, among other concerns, underscore the importance of particle detection, adhesion and removal. On the other hand, | however, in certain instances particle adhesion to surfaces is necessary. The purpose of this symposium is to address the vast ramifications of particles on solid surfaces by bringing together specialists in many allied fields to discuss their latest findings and to identify areas for further investigation. Various types of substrates and particles --metals, oxides, glass, and polymers-- will be covered. The technical program will comprise both invited and contributed papers ranging from topical overviews to original research and industrial applications. |
The symposium will emphasize the following
topics:
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This symposium is being organized under the direction
of Dr. K. L. Mittal, Editor, Journal of Adhesion Science
and Technology by MST Conferences, LLC. A
proceedings volume is planned for this symposium and
further details will be provided in due course. Please
notify the conference chairman of your intentions to
present a paper as early as possible. An abstract of
about 200 words should be sent by January 15, 2006
to the conference chairman by any of the following
methods:
E-mail: rhl@mstconf.com FAX: 212-656-1016 Regular mail: Dr. Robert H. Lacombe Conference Chairman 3 Hammer Drive Hopewell Junction, NY 12533 Contact by phone: 845-897-1654; 845-227-7026 |
CLICK HERE TO SUBMIT AN ABSTRACT OR GET ON CONFERENCE MAILING LIST: ONLINE RESPONSE FORM